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Research Directors, Research Themes
JST > CREST > DVLSI HOME > Principal Investigator, Research Themes

Research that started in 2007

Principal Investigator Research Themes
Hidetoshi Onodera
(Kyoto University / Professor)
Dependable VLSI platform using robust fabrics
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Shuichi Sakai
(The University of Tokyo / Professor)
Ultra Depedable VLSI by collaboration of formal verifications and architectural technologies
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Kazuo Tsubouchi
(Tohoku University / Professor)
Development of Dependable Wireless System and Device
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Hiroto Yasuura
(Kyushu University / Professor)
Modeling, Detection, Correction and Recovery Techniques for Unified Dependable Design
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Research that started in 2008

Principal Investigator Research Themes
Seiji Kajihara
(The Kyushu Institute of Technology / Professor)
Circuit and system mechanisms for high field reliability
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Masahiko Yoshimoto
(Kobe University / Professor)
Dependable SRAM Techniques for Highly Reliable VLSI System
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Tomohiro Yoneda
(The National Institute of Informatics / Professor)
Development of Dependable Network-on-Chip Platform
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Research that started in 2009

Principal Investigator Research Themes
Mitsumasa Koyanagi
(Tohoku University / Professor)
Three-Dimensional VLSI System with Self-Restoration Function
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Ken Takeuchi
(Chuo University / Professor)
Dependable Wireless Solid-State Drive (SSD)
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Takeshi Fujino
(Ritsumeikan University / Professor)
The Design and Evaluation Methodology of Dependable VLSI for Tamper Resistance
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Nobuyuki Yamasaki
(Keio University / Associate Professor)
Fundamental Technology on Dependable SoC and SiP for Embedded Real-Time Systems
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