[Naoka Nagamura] Functional design of two-dimensional devices using the data-centric multi-dimensional X-ray imaging

Research Director

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Naoka Nagamura

National Institute for Materials Science
Research Center for Advanced Measurement and Characterization
Researcher

Tohoku University
Institute of Multidisciplinary Research for Advanced Materials
Assistant Professor

Outline

Two dimensional materials, especially atomic-layer materials, have potential to be applied to high-efficient electronic devices and energy devices. However, controlling the device characteristics is quite difficult because the environmental factors such as interface interactions and defect-effects are remarkable for device performances compared to the facters derived from bulk properties.
In this proposal, I work on constructing the multi-dimensional X-ray imaging technology by combining a scanning photoelectron microscopy system using synchrotron radiation X-rays and machine-learing approaches for large-scale spectral data analysis.
Then, I aim to construct a database of environmental factors for atomic-layer materials which is indispensable for predicting the device performance of novel structures of two-dimensional devices, through operando spectromicroscopy of real devices.

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