[Naoka Nagamura] Functional design of two-dimensional devices using the data-centric multi-dimensional X-ray imaging

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Naoka Nagamura

National Institute for Materials Science
Research Center for Advanced Measurement and Characterization

Tohoku University
Institute of Multidisciplinary Research for Advanced Materials
Assistant Professor


Two dimensional materials, especially atomic-layer materials, have potential to be applied to high-efficient electronic devices and energy devices. However, controlling the device characteristics is quite difficult because the environmental factors such as interface interactions and defect-effects are remarkable for device performances compared to the facters derived from bulk properties.
In this proposal, I work on constructing the multi-dimensional X-ray imaging technology by combining a scanning photoelectron microscopy system using synchrotron radiation X-rays and machine-learing approaches for large-scale spectral data analysis.
Then, I aim to construct a database of environmental factors for atomic-layer materials which is indispensable for predicting the device performance of novel structures of two-dimensional devices, through operando spectromicroscopy of real devices.

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