Research Director

Outline

We aim to visualize complex optical field distribution with one nanometer spatial resolution using cathodoluminescence scanning transmission electron microscopy. A focus electron beam enables “light” imaging beyond the wavelength (diffraction) limit of light. Although an accelerated electron carries no optical phase, we in this study extract the phase information by interference of radiations from reference and target samples both coherently excited by a single electron. We plan to apply this method to bioimaging and optical materials analysis.