Business overview

Purpose

This project promotes the development of systems and technology for advanced measurement and analysis in order to meet frontier research needs(including future use at actual production sites). It carries out innovative development, based on the above approach, through the following three programs. JST widely calls for proposals from development teams, and reviews and selects proposals.



Overview

The project involves the following three programs.

Technology Development Program for Advanced Measurement and Analysis (Program-T)

This program seeks to develop novel and creative technology for advanced measurement and analysis such as may rapidly improve the performance of systems for measurement and analysis.

System Development Program for Advanced Measurement and Analysis (Program-S)

This program seeks to develop systems needed for advanced measurement and analysis in frontier research areas. It assembles development teams that closely interface with industry, academia and government; operates under an authoritative team leader; carries out research and development ranging from enabling technologies to applied development to prototyping.

Prototype Validation/Practical Realization Program for Advanced Measurement and Analysis (Program-P)

This program seeks to develop prototypes up to the practical realization by verifying, improving, optimizing, or generalizing the prototype. It assembles development teams that closely interface with industry, academia and government; operates under an authoritative team leader from the industrial side and Users at the worldfs top level also participate in the development team.

Notice

We will be participating in the Pittsburgh Conference (Pittcon 2009), which is one of the worldfs largest analytical device exhibitions and conferences (to be held in Chicago, Illinois from March 8 through to the 13 local time).
  • Period (local time): March 8 (Sun.) - 13 (Fri.)
    Host website: http://www.pittcon.org/
  • Venue: McCormick Place (Chicago, Illinois, U.S.A.)
    Venue website: http://www.pittcon.org/
  • Oral presentation (in local time)
    March 12 (Thu.) Time: 11:05 - Venue: N426c
    Developing a New Mass Microscopy System Based on a QIT-TOF System
    (Mitsutoshi Seto, Hamamatsu University School of Medicine)
  • Devices to be exhibited (Booth No: #3307)
    Period of exhibition (local time): March 8 (Sun.) - 12 (Thu.)
    Time: 9:00 - 17:00 (Until 15:00 on the 12th)

    • -The New System for Mass Microscopy based on a QIT-TOF system (Mitsutoshi Seto, Hamamatsu University School of Medicine)
    -Handy-type Total Reflection X-ray Fluorescence Elemental Sensor (Jun Kawai, Kyoto University)
    -NMR Probeheads for Mass-limited Solid-state Samples (Kazuo Yamauchi, Tokyo University of Agriculture and Technology)