Charge trap site and photo-degradation processes in photoelectric conversion system as revealed by wavelength-tunable transient absorption microscopy

Tetsuro Katayama

Research Assistant Professor, Institute for Nano Science Design, Osaka University

Abstract

One of the most problems of impairing the photoelectric convesrion and operational stability are charge tapping and photo-degradation processes. It is difficult, however, to elucidate the factor of them because of its spatial inhomogeneity. In this reseach, the new transient absorption microscopy system will be developped and utilized to reveal the factor of charge trapping and photo-degradation. These result will contribute to the guidance for highly efficient photoelectric conversion systems and the developments of applicational organic solar cell.