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Foundation of the Nano-Interface Technology by the Surface Forces Measurement

Research Project Outline

The aim of this project is to create the novel nano-interface science and technology for designing functional nano-materials and devices for the next generation technology. The main tools are our original “twin-path surface forces apparatus” and “resonance shear measurement”, which will be further devel-oped by combining them with other spectroscopic methods. We consider even liquids at the interface as functional mole-cules. Subjects studied will include; (1) characterization of functional interfaces such as metals, (2) confi ned liquids and photoreactions in a confi ned space, (3) self-assembled forma-tion and regulation of hierarchical structures at the interface.

Research Director
Professor, Tohoku University
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Research Area
Development of the Foundation for Nano-Interface Technology
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