Three-Dimensional VLSI System with Self-Restoration Function

Research Project Outline

We aim to develop a new dependable VLSI by employing a three-dimensional (3D) LSI and highly parallel processing which can provide functions of self-restoration, self-organization, self-repair, reconfiguration and self-test. This new VLSI has function generators with look-up tables which generate redundancy and self-test circuits. A part of these redundancy and self-test circuits are dynamically converted to functional logic circuits to enhance the flexibility and efficiency of LSI.

Research Director
MitsumasaKoyanagi
Affiliation
Professor, Tohoku University
Research Started
2009
Status
ongoing
Research Area
Fundamental Technologies for Dependable VLSI System
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