Dependable SRAM Techniques for Highly Reliable VLSI System

Research Project Outline

The goal of the project is to develop design techniques for scaled SRAM to enhance a dependability of VLSI system in deep sub-deci micron era and beyond. To overcome several error factors including process variation, operating condition fl uctuation, performance degradation by aging and soft error phenomena, we will develop fundamental techniques to predict failure situations, to sustain normal state of operation and to avoid fatal errors. Then by unifying the above techniques, an autonomous dependable memory platform will be established. Finally effectiveness of proposed methods will be verifi ed for car-electronics application using virtualization techniques.