Circuit and System Mechanisms for High Field Reliability

Research Project Outline

With the progress of VLSI technology, it becomes a crucial issue to deal with faults that occur in operational mode as well as the production test. In our work, we propose new mecha-nisms of circuits and systems that allow adaptive power-on testing to detect problems caused by aging and faults of VLSIs operating on the fi eld, and to warn or recover before an error appears. The work tries to contribute not only to extension of MTTF (Mean Time To Failure) but also to supply of safe and secure systems for users.

Research Director
Professor, The Kyushu Institute of Technology
Research Started
Research Area
Fundamental Technologies for Dependable VLSI System
Research Areas by Category
Research Areas Completed
Researcher Index