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Ultra Dependable VLSI by Collaboration of Formal Verifications and Architectural Technologies

Research Project Outline

For precise and errorless design of VLSI which is one of the most primary elements in today's information-centric society, this project will comprehensively develop dependability technologies from circuit design to system architectures. It includes new formal verification techniques, introductions of field programmable circuits for the test-phase corrections, the circuit which prevents timing errors and architectural technologies to prevent permanent failures. These techniques will be tightly integrated and will substantially increase VLSI dependability. The research results will include the new design tools, new digital circuits and architectures which will be fed back to industry and will construct the basis to reinforce the industrial competitiveness in the area of semiconductors, home electronics, automobiles and aerospace technologies.

Research Director
ShuichiSakai
Affiliation
Professor, The University of Tokyo
Research Started
2007
Status
ongoing
Research Area
Fundamental Technologies for Dependable VLSI System
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