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Development of Dependable Wireless System and Device

Research Project Outline

For implementing wide-area and high-data-rate wireless access, we are developing a dependable wireless next-generation network (NGN) large-scale integrated circuit (LSI) with optimum control of communication area, data rate, power consumption and quality of service (QoS). This broadband allsilicon mixed signal complementary metal-oxide-silicon (CMOS) chip set achieves low bit error rate (BER) using frequency domain equalization (FDE). The research will contribute to realize high-mobility and ultra high-data-rate mobile terminal.

Research Director
KazuoTsubouchi
Affiliation
Professor, Tohoku University
Research Started
2007
Status
ongoing
Research Area
Fundamental Technologies for Dependable VLSI System
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