Research Project Outline
Today, the spatial- and time-resolved structural study under photo-irradiation, electronic field, magnetic field and etc. is becoming more and more important in the research and development field of the nano-materials and devices. Our project is aiming to develop the advanced X-ray measurement technique in nano-meter spatial scale and/or pico-second time scale by using the third generation synchrotron radiation at SPring-8. By this "X-ray pinpoint structural measurement", we will explore the novel concept and/or phenomena for the nanomaterials and devices, and demonstrate the validity of the method.