HOME > Research Areas by Category > Novel Measuring and... > Low-voltage TEM/STEM for...

Low-voltage TEM/STEM for Atomic Level Characterization of Soft Matters

Research Project Outline

Organic or biological molecules are very sensitive to the electron beam and have been considered quite difficult to observe by means of electron microscopes. This is because an intrinsic problem of the specimen damage due to the incident highenergy electron beam, which is definitely required for high spatial resolution imaging. In order to overcome this drawback, we will build a low-voltage TEM/STEM equipped with the aberration correctors. This machine will be capable to visualize the individual molecular structures of soft matters with higher resolution and less damage than ever.

Research Director
Team Leader, National Institute for Advanced Industrial Science and Technology (AIST)
Research Started
Research Area
Novel Measuring and Analytical Technology Contributions to the Elucidation and Application of Material
Research Areas by Category
Research Areas Completed
Researcher Index