Research Project Outline
When a medium is irradiated with light beams of two different frequencies, it radiates another light field with the sum frequency. In an optical sum frequency (SF) microscope, this light field is focused on a two-dimensional detector and a sum frequency image is obtained. This project aims to develop a SF microscope with functions of dynamical and three-dimensional vibrational imaging and electronic state investigation at surfaces and interfaces. Phenomena obervable only by this microscope are planned to be analalyzed.