Development of a Multi-functional Optical Sum Frequency Microscope

Research Project Outline

When a medium is irradiated with light beams of two different frequencies, it radiates another light field with the sum frequency. In an optical sum frequency (SF) microscope, this light field is focused on a two-dimensional detector and a sum frequency image is obtained. This project aims to develop a SF microscope with functions of dynamical and three-dimensional vibrational imaging and electronic state investigation at surfaces and interfaces. Phenomena obervable only by this microscope are planned to be analalyzed.

Research Director
Professor, Japan Advanced Institute of Science and Technology
Research Started
Research Area
Novel Measuring and Analytical Technology Contributions to the Elucidation and Application of Material
Research Areas by Category
Research Areas Completed
Researcher Index