 |
| 1) |
ιΨ@ΧAME_AnΣ²VA|³ |
| C²zόrX}XwσUdΜLpV^ΜΑ«ΙyΪ·Ud«ΜψΚ |
| ζ51ρp¨wοΦAΦWAuο |
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| 2) |
nΣ²VAXͺmAͺ{―iA΄‘AμϋSρA{RAME_ |
| Effect of Thermal Strain on Domain Fraction in a-/b-axis-oriented Epitaxial Bi4Ti3O12 Films |
| Proceeding of Material Research Society Mater. Res. Soc. Proc., 784(2004)C4.2., 109-114 |
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| 3) |
ιΨ@ΧAξΰ΄‘AnΣ²VA|³AME _ |
| rX}XwσUdΜΜUd¦ΜαoCAXΛΆ« |
| ζ65ρp¨wο wpuο |
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| 4) |
΄‘AιΨ@ΧAͺ{―iAME_ |
| c²zό(Ca,Sr)Bi4Ti4O15ΜdCΑ«ΙyΪ·ΚΰEΚOzόΜψΚ |
| ζ65ρp¨wο wpuο |
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| 5) |
ξΰ΄‘AιΨ@ΧAͺ{―iAβΊKYAHaydn ChenAME_ |
| c²zό(Ca, Sr)Bi4Ti4O15ΜΚΰzό§δ |
| ζ65ρp¨wο wpuο |
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| 6) |
H. Funakubo, T. Kojima, and T. Watanabe, Y. Sakashita, K. Kato |
| Thickness Independent Dielectric Property of c-axis Oriented Bismuth Layer Structured Dielectric (BLSD) Films |
| 11th Int. Work. on Oxide Electronics |
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| 7) |
Kenji Takahashi, Shoji Okamoto, Yukio Sakashita, Haydn Chen and Hiroshi Funakubo |
| Growth and Characterization of Degradation-Free c-Axis-Oriented (Cax, Sr1-x)Bi4Ti4O15 Thin-Film Capacitors. |
| 2004 MRS Fall Meeting |
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| 8) |
ME_A¬Έ²uAnΣ²VA΄‘AιΨ@ΧAβΊKYAyμMOAΑ‘κό |
| rX}XwσUdΜΜTCYψΚt[Α«ΜNΉ |
| ϊ{Z~bNX¦ο2005NNο |
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| 9) |
H.Funakubo, T.Kojima, T.Watanabe, M.Suzuki, K.Takahashi, K.Kato, Y.Sakashita, |
| Origin of Size Effect Free Characteristics of Bithmuth Layer Structured Dielectrics Thin Films |
| The American Ceramic Society, 107th Annual meeting |
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| 10) |
ιΨ@ΧAξΰ΄‘AnΣ²VA|³AME_ |
| rX}Xwσ\’UdΜΜ»\’Ωϋ«πp΅½UdΑ«Μ§δ |
| ζ66ρp¨wοwpuο |
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| 11) |
ξΰ΄‘AιΨ@ΧA¬Έ²uAME_ |
| c²zόSrBi4Ti4O15ΜUdΑ«Ι¨―ιΚΰΝΜψΚ |
| ζ66ρp¨wοwpuο |
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| 12) |
ξΰ΄‘AιΨ@ΧAg{μAME_ |
| c²zόGs^LVSrBi2Ta2O9Μ¬·@\ |
| ζ66ρp¨wοwpuο |
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| 13) |
Takayuki Watanabea and Hiroshi Funakubo |
| Selective Reaction and Chemical Anisotropy in Epitaxial Bismuth Layer-structured Ferroelectric Thin Films |
| J. Solid State Chem.178(2005)64-71 |
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| 14) |
Takayuki Watanabe1 and Hiroshi Funakubo |
| Epitaxial Growth Map for Bi4Ti3O12 Films: a Determining Factor for Crystal Orientation |
| Jpn. J. Appl. Phys.44(3)(2005)1337-1343 |
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| 15) |
Hiroshi Funakubo, Takayuki Watanabe, Hitoshi Morioka, Atsushi Nagai, Takahiro Oikawa, Muneyasu Suzuki, Hiroshi Uchida, Seiichiro Kouda, Keisuke Saito |
| Polarization comparison of Pb(Zr,Ti)O3 and Bi4Ti3O12 ?based ferroelectrics |
| Mater. Sci. Eng. B118(2005)23-27 |
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| 16) |
ME_A΄‘A¬²uAnΣ²VAιΨ@Χ |
| RfTήΏΜJ |
| »wHΖ56(7)(2005)37-41 |
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| 17) |
Kenji Takahashi,Muneyasu Suzuki,Takahiro Oikawa,Haydn Chen,Hiroshi Funakubo |
| Effect of Deposition Temperature and Post-Heat-Treatment Condition on the Characteristics of (100)-Self-Orientation@LaNiO3 Films Prepared by RF Magnetron Sputter Deposition |
| Proceeding of Material Research Society, Mater. Res. Soc. Proc., 833(2005)G1.9.1-G1.9.6 |
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| 18) |
Akihiro Sumi, Kenji Takahashi, Shintaro Yokoyama, Hitoshi Morioka, Hiroshi Funakubo, Mamoru Yoshimoto |
| Metalorganic Chemical Vapor Deposition of Atomically Flat SrRuO3 Films on Stepped SrTiO3 Substrates |
| Appl. Phy. Lett. 87, 1(2005) |
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| 19) |
Takayuki Watanabe, Hiroshi Funakubo, Minoru Osada, Hiroshi Uchida, Isao Okada |
| The effects of neodymium content and site occupancy on spontaneous polarization of epitaxial (Bi4-xNdx)Ti3O12 films |
| J. Appl. Phys, 98(2005)0241101-1 - 0241101-6 |
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