Research Project

Development of atomic-resolution electromagnetic field imaging electron microscopy for interface analysis

Profile

Naoya Shibata

Outline

Heterointerfaces are key component to develop high-efficiency, better property materials and devices for environmental and energy usages. To control interface properties, it is essential to understand their atomic structures and resultant local potential structures with associating electromagnetic fields. The main objective of this project is to develop a new electron microscopy technique for characterizing atomic-scale structures and resultant electromagnetic fields based on aberration-corrected electron microscopy. This new method will be applied to understand the origin of interface properties in energy materials and devices.