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Presented documents on the DVLSI Program Review has been released. ...Program
Opening remarks by the research supervisor
| "Presented title"--Name-- Affiliation |
download |
"Opening remarkas on the DVLSI Program Review"
Dr. Shojiro Asai
Vice President, Rigaku Corporation |
→PDF 178kB |
Documents of moderators (the order of sessions)
| "Presented title"--Name-- Affiliation |
download |
"Design Verifications & Test" What are dependability indices of VLSIs?
Prof. Shigeru Oho
(Nihon-kogyo Univ.) |
→PDF 404kB |
"Architectures & Circuits" How can we define indices for dependability of VLSIs?
Prof. Masahiko Yoshimoto
(Kobe Univ.) |
→PDF 90kB |
Documents of the invited panelists (the order of sessions)
| "Presented title"--Name-- Affiliation |
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「An Era of Embedded Systems」,「100M Dollar Lessons」
Prof. Jiang Xu
（Hong Kong University of Science and Technology） |
→PDF 496kB
→PDF 467kB |
"Design Verifications & Test" Challenges of Logic Verification of VLSI
Dr. Koichiro Takayama
(Fujitsu Ltd.) |
→PDF 537kB |
"Design Verifications & Test" Issues in Secure DVLSI Design
Dr. Sumio Morioka
(NEC Ltd. Central Research Lab.) |
→PDF 1,330kB |
"Design Verifications & Test" Automotive Functional Safety Standard ISO26262 and Design Verification Technology
Dr. Yoshihiro Miyazaki
(Hitachi Auto Motive Systems Ltd.) |
→PDF 1,170kB |
"Network & Connectivity" Advanced Wireless Cooperation mechanisms for Interference Mitigation in the 2.4 GHz ISM Band
Dr. Fumio Ishizu
(Mitsubishi Electric Ltd.) |
→PDF 247kB |
"Network & Connectivity" Functional Safety and Dependability
Dr. Kohei Nadehara
(Renesas Electronics Ltd.) |
→PDF 155kB |
"Architectures & Circuits" Challenge for developed technologies
Dr. Ken'ichi Osada
(Hitachi Central Research Lab.) |
→PDF 153kB |
"Architectures & Circuits" Image of Trading Market for ECU Model
Dr. Kenji Anami
(Institute of Systems, Information Technologies and Nanotechnologies) |
→PDF 390kB |
Documents of the research team panelists (the order of sessions)
| "Presented title"--Name-- Affiliation |
download |
"Design Verifications & Test" From the Viewpoint of Functional Safety
Associate Prof. Makoto Sugihara (Joint research member)
(Kyushu Univ.) |
→PDF 173kB |
"Design Verifications & Test" Circuit and System mechanism for high field reliability
Prof. Seiji Kajihara (Research director)
(Kyushu Institute of Technology) |
→PDF 550kB |
"Design Verifications & Test" Verification & Test on LSI design
Prof. Takeshi Fujino (Research director)
(Ritsumeikan Univ.) |
→PDF 1,020kB |
"Design Verifications & Test"
Prof. Masahiro Fujita (Joint research member)
(Univ. of Tokyo) |
→PDF ***kB |
"Network & Connectivity" Development of Dependable Wireless System and Device
Prof. Emeritus Kazuo Tsubouchi (Research director)
(Tohoku Univ.) |
→PDF 311kB |
"Network & Connectivity" Multi-Chip NoC Approach for Automotive Applications
Prof. Tomohiro Yoneda (Research director)
(National Institute of Informatics) |
→PDF 1,018kB |
"Network & Connectivity" Dependable Wireless Solid-State Drive(SSD)
Prof. Ken Takeuchi (Research director)
(Chuo Univ.)
Associate Prof. Hiroki Ishikuro (Joint research member)
(Keio Univ.) |
→PDF 1,150kB |
"Architectures & Circuits" Fundamental Technology on Dependable SoC and SiP for Embedded Real-Time Systems
Associate Prof. Nobuyuki Yamasaki (Research director)
(Keio Univ.) |
→PDF 5,450kB |
"Architectures & Circuits" Achieving Ultra Dependable VLSI
Prof. Syuichi Sakai (Research director)
(Univ. of Tokyo) |
→PDF 577kB |
"Architectures & Circuits" Architecture and Circuits for Dependable 3D-VLSI
Prof. Mitsumasa Koyanagi (Research director)
(Tohoku Univ.) |
→PDF 2,400kB |
"Architectures & Circuits" Dependable VLSI Platform using Robust Fabrics
Prof. Kazutoshi Kobayashi (Joint research member)
(Kyoto Institute of Technology) |
→PDF 708kB |
"Architectures & Circuits" Dependable Memory Techniques for Highly Reliable VLSI System
Dr. Koji Nii (Joint research member)
(Renesas Electronics Ltd.) |
→PDF 857kB |
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