Presto Researcher

Tomoko Shimizu
Advanced Key Technologies Division, National Institute for Materials Science
Senior Researcher

Outline

Scanning probe microscopy enables investigation of structures of both conducting and insulating surfaces as well as properties of adsorbed molecules at the atomic scale. Its application is, however, limited to atomically flat materials. To overcome this drawback, a new type of a scanning probe microscope and novel imaging protocols based on a precise control of the probe trajectory at the picometer scale are proposed. The aim is to establish a technique to simultaneously characterize structures and material properties, including electronic states and interactions, of newly developed porous materials and other types of materials created with three dimensional geometrical designs at the nano scale.