JST科学技術振興機構　Research Themes and representatives : Novel Measuring and Analytical Technology Contributions to the Elucidation and Application of Material

Core Research for Evolutional Science and Technology (CREST)　Strategic Sector: Creation of basic technology for the realization of leading edge measuring and analytical equipment through the development of new techniques, etc

R005 Electron Microscopy for Light Elements Imaging and Analysis

Kunio Takayanagi
Professor, Tokyo Institute of Technology

　Behavior of light elements such as C, O, N are of increasing importance in nanomaterials science and technology. We develop a new electron microscope system with aberration correction lenses. The system with 0.05nm resolution (R005) enables us to observe light elements directly to reveal nanomaterials' structures and there dynamics. This work will open a research field, physics and chemistry of light elements.