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Fundamental Technologies for Dependable VLSI System

Research Area Website

Strategic Sector

Development of Fundamental Technologies for the Large-scale Integrated-circuit System that can Guarantee High Reliability and High Security

Research Supervisor

Shojiro Asai (Executive Vice President, Rigaku Corporation)

Year Started

2007 

Outline

This Research Area covers the R & D of fundamental technologies for the VLSI system that can guarantee high reliability and high security. It is a societal requirement today to guarantee the reliability and security of information systems, on which human activities depend to an ever increasing extent. The VLSI, its engine, is also a gigantic system itself containing a huge number of circuit elements, and its reliability and security is at the core of those of any information system. This Research Area addresses problems that have to be solved to realize VLSI systems with advanced levels of integration, while ensuring required reliability and security. To be concrete, the scope of this Research Area includes subjects as follows. Some of the major physical problems are fluctuation associated with ultimate miniaturization of integrated-circuit elements, single-event data failure, and deterioration brought by long time use. These degrading factors not only cause malfunctions, but also might prevent a VLSI from large-scale integration. An extensive search for novel technologies to alleviate those factors is required at the device level, circuit level, and system level. On the other hand, because large-scale integration by miniaturization will soon reach its limit, technologies for packaging many chips in three dimensions while ensuring reliability and security are also important subjects. Another R & D subjects are design techniques that prevent mistakes in design that accompanies increase in the scale of integration and complexity of system. Software that facilitates design, verification, manufacturing, and testing is sought for. Also required is R & D of architecture and circuits that detect, confine, and relieve threats to reliability and security from inside and outside of the VLSI system during operation. Requirements for a VLSI system come from the quality and performance requirements of the information system it is used in. How to specify and evaluate reliability and security requirements for the VLSI system is also a subject of this Research Area.

Year Started : 2009

Mitsumasa Koyanagi
Professor, Tohoku University
Ken Takeuchi
Associate Professor, University of Tokyo
Takeshi Fujino
Professor, Ritsumeikan University
Nobuyuki Yamasaki
Associate Professor, Keio University

Year Started : 2008

 Seiji Kajihara
Professor, The Kyushu Institute of Technology
Masahiko Yoshimoto
Professor, Kobe University
Tomohiro Yoneda
Professor, The National Institute of Informatics

Year Started : 2007

Hidetoshi Onodera
Professor, Kyoto University
Shuichi Sakai
Professor, The University of Tokyo
Kazuo Tsubouchi
Professor Emerius, Tohoku University
Hiroto Yasuura
Trustee and Vice President, Kyushu University