Innovative Molecular Structure Analysis based on Self-Assembly Technology

Research Director

Makoto Fujita

Makoto Fujita

(Professor, School of Engineering, The University of Tokyo)

1987 Ph.D.Tokyo Institute of Technology
1988 Assistant Professor, Chiba University
1991 Lecturer, Chiba University
1994 Associate Professor, Chiba University
1996 Associate Professor, Institute for Molecular Science (IMS), Okazaki National Research Organization
1999 Professor, Graduate School of Engineering, Nagoya University
2002 Professor, School of engineering, The University of Tokyo

Program Manager

Atsuo Ezaki

Atsuo Ezaki

(ACCEL Program Manager, Japan Science and Technology Agency)

1978 Bachelor of Industrial Chemistry, Tokyo Metropolitan University
1980 Master of Industrial Chemistry, Tokyo Metropolitan University Graduate School
1980 Joined Konishiroku Photo Ind. Co., Ltd. (Konica Minolta, Inc.)
1999 Manager, Business Planning Dept. Ink Jet Tech. Business Center, Konica Corporation
2008 General Manager, System Solution Tech. R&D Lab., Konica Minolta TC, Inc.
2012 General Manager, OLED Lighting Business Center, Konica Minolta AL, Inc.
2015 Advisor, Technology Strategy Division, Konica Minolta, Inc.
2016 ACCEL Program Manager, JST

R&D Term

2014 Apr - 2019 Mar

Outline of R&D Project

Over the period of CREST program, we have developed a series of metal coordination networks with controlled nano-sized pores and introduced and demonstrated a novel concept of X-ray structural analysis, named the “crystalline sponge method”.
This methodology enables X-ray structural analysis of small molecules without preparing its single crystal, instead, by simply absorbing molecules of interest into a porous crystalline material.
We plan to boost up the “crystalline sponge method” to the practical stage and make it widely accessible through ACCEL.

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Program

Program
  • CREST
  • PRESTO
  • ERATO
  • ACCEL
  • ACT-C
  • Promoting Globalization on Strategic Basic Research Programs
  • ALCA
  • RISTEX
  • ACT-I
  • s_innov
  • Development of Advanced Measurement and Analysis Systemsicon
Finish programs
  • Pamphlet